Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance (Record no. 17314)

000 -LEADER
fixed length control field 00530nam a2200145Ia 4500
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION
fixed length control field 230130s9999||||xx |||||||||||||| ||und||
020 ## - INTERNATIONAL STANDARD BOOK NUMBER
International Standard Book Number 9783319005904
100 ## - MAIN ENTRY--PERSONAL NAME
Personal name Kipp van Schooten
245 #0 - TITLE STATEMENT
Title Optically Active Charge Traps and Chemical Defects in Semiconducting Nanocrystals Probed by Pulsed Optically Detected Magnetic Resonance
250 ## - EDITION STATEMENT
Edition statement 2013
260 ## - PUBLICATION, DISTRIBUTION, ETC.
Name of publisher, distributor, etc. Springer International Publishing
Date of publication, distribution, etc. 2013
440 ## - SERIES STATEMENT/ADDED ENTRY--TITLE
Title Springer Theses
650 ## - SUBJECT ADDED ENTRY--TOPICAL TERM
Topical term or geographic name entry element Physics and Astronomy
856 ## - ELECTRONIC LOCATION AND ACCESS
Uniform Resource Identifier <a href="https://doi.org/10.1007/978-3-319-00590-4">https://doi.org/10.1007/978-3-319-00590-4</a>
Holdings
Withdrawn status Lost status Damaged status Not for loan Home library Current library Date acquired Barcode Date last seen Uniform Resource Identifier Price effective from Koha item type
      Accessible Online ICTS ICTS 01/30/2023 EBK14079 01/30/2023 https://doi.org/10.1007/978-3-319-00590-4 01/30/2023 electronic book