Ferroelectric-Gate Field Effect Transistor Memories

By: Byung-Eun Park, Hiroshi Ishiwara, Masanori Okuyama, Shigeki Sakai, Sung-Min YoonMaterial type: TextTextSeries: Topics in Applied PhysicsPublication details: Springer Netherlands 2016Edition: 1st ed. 2016ISBN: 9789402408416Subject(s): Physics and AstronomyOnline resources: Click here to access online
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current library Call number URL Status Date due Barcode Item holds
electronic book electronic book ICTS
Link to resource Accessible Online EBK11332
Total holds: 0

There are no comments on this title.

to post a comment.