TY  - BOOK
AU  - Sheldon Tan, Mehdi Tahoori, Taeyoung Kim, Shengcheng Wang, Zeyu Sun, Saman Kiamehr
TI  - Long-Term Reliability of Nanometer VLSI Systems
SN  - 9783030261726
PY  - 2019///
PB  - Springer International Publishing
KW  - Physics and Astronomy
UR  - https://doi.org/10.1007/978-3-030-26172-6
ER  -