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1.
Charged Semiconductor Defects

by Edmund G. Seebauer, Meredith C. Kratzer.

Series: Engineering Materials and ProcessesEdition: 2009Material type: Text Text Publication details: Springer London 2009Online access: Click here to access online Availability: Items available for reference: Accessible Online (1). : Location(s): .

2.
Melt Rheology and its Applications in the Plastics Industry

by John M Dealy, Jian Wang.

Series: Engineering Materials and ProcessesEdition: 2nd ed. 2013Material type: Text Text Publication details: Springer Netherlands 2013Online access: Click here to access online Availability: Items available for reference: Accessible Online (1). : Location(s): .