000 00496nmm a2200145Ia 4500
008 230202s9999||||xx |||||||||||||||||und||
020 _a9783540389101
100 _aY. Waseda
245 0 _aNovel Application of Anomalous (Resonance) X-ray Scattering for structural Characterization of Disordered Materials
250 _a1984
260 _bSpringer Berlin Heidelberg
_c1984
440 _aLecture Notes in Physics
650 _aPhysics and Astronomy
856 _uhttps://doi.org/10.1007/BFb0025745
999 _c26421
_d26421